Oncins Marco, GerardDíaz Marcos, Jordi2012-10-012012-10-012012https://hdl.handle.net/2445/32162Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research works performed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.10 p.application/pdfeng(c) Universitat de Barcelona, 2012Microscòpia de força atòmicaNanotecnologiaAnàlisi instrumentalAtomic force microscopyNanotechnologyInstrumental analysisinfo:eu-repo/semantics/bookPartinfo:eu-repo/semantics/openAccess