Dellunde i Clavé, JaumeTorrent, M. C. (Maria Carme)Sancho, José M.Shore, K. A.2009-06-032009-06-0319970018-9197https://hdl.handle.net/2445/8502The turn-on process of a multimode VCSEL is investigated from a statistical point of view. Special attention is paid to quantities such as time jitter and bit error rate. The single-mode performance of VCSEL¿s during current modulation is compared to that of edge-emitting lasers.8 p.application/pdfeng(c) IEEE, 1997DinàmicaLàsers de semiconductorsEstadísticaDynamicsSemiconductor lasersStatisticsinfo:eu-repo/semantics/article118390info:eu-repo/semantics/openAccess