Coll Benejam, CatalinaLópez Conesa, LluísRebled, J. M. (José Manuel)Magén, CésarSánchez Barrera, FlorencioFontcuberta i Griñó, JosepEstradé Albiol, SòniaPeiró Martínez, Francisca2018-10-022018-10-022017-04-061932-7447https://hdl.handle.net/2445/124987LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images5 p.application/pdfeng(c) American Chemical Society , 2017Pel·lícules finesThin filmsinfo:eu-repo/semantics/article6718352018-10-02info:eu-repo/semantics/openAccess