Van Der HofstadtFabregas, ReneBiagi, Maria ChiaraFumagalli, Laura, 1959-Gomila Lluch, GabrielSerrano, Marc2018-09-052018-09-052016-09-060957-4484https://hdl.handle.net/2445/124317Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode. We introduce a method to quantify and subtract the topographic crosstalk from the lift-mode EFM images, and a 3D numerical approach that allows for extracting the local dielectric constant with nanoscale spatial resolution free from topographic artifacts. We demonstrate this procedure by measuring the dielectric properties of micropatterned SiO2 pillars and of single bacteria cells, thus illustrating the wide applicability of our approach from materials science to biology.13 p.application/pdfeng(c) Institute of Physics (IOP), 2016DielèctricsNanotecnologiaMicroscòpia de força atòmicaDielectricsNanotechnologyAtomic force microscopyinfo:eu-repo/semantics/article6676632018-09-05info:eu-repo/semantics/openAccess27597315