Sánchez, DavidGómez, SergioMauricio Ferré, JoanFreixas, LluisSanuy Charles, AndreuGuixé, GerardLópez, AlbertManera Escalero, RafelMarín, JesúsPérez, José.M.Picatoste Olloqui, EduardoPujol, CarolinaSanmukh, AnandRato, PedroVela, ÓscarGascón Fora, David2024-07-022024-07-022022-01-012469-7311https://hdl.handle.net/2445/214176Abstract: Time-of-Flight positron emission tomography scanners demand fast and efficient photo sensors and scintillators coupled to fast readout electronics. This article presents the high resolution flexible Time-over-Threshold (HRFlexToT), a 16-channel application-specific-integrated circuit for silicon photomultipliers (SiPM) anode readout manufactured using XFAB 0.18- μm CMOS technology. The main features of the HRFlexToT are a linear Time-over-Threshold with an extended dynamic range (10 bits) for energy measurement, low power consumption (≈ 3.5 mW/ch), and an excellent timing response. The experimental measurements show an energy linearity error of ≈ 3% and an energy resolution of about 12% at 511 keV. Single-photon time resolution measurements performed using an Fondazione Bruno Kessler (FBK) SiPM NUV-HD ( 4×4 mm2 pixel, 40- μm cell) and a Hamamatsu SiPM S13360-3050CS are around 142 and 167 ps full width at half maximum (FWHM), respectively. Coincidence time resolution (CTR) measurements with small cross-section pixelated crystals (LSO:Ce,Ca 0.4%, 2×2×5 mm3) coupled to the same Hamamatsu S13360-3050CS and FBK NUV-HD sensors yield a CTR of 117 ps and 119 ps, respectively. Measurements performed with a large cross-section monolithic crystal (LFS crystal measuring 25×25×20 mm3) and a Hamamatsu SiPM array S13361-6050NE-04 show a CTR of 324 ps FWHM after time-walk and time-skew correction.17 p.application/pdfeng(c) Institute of Electrical and Electronics Engineers (IEEE), 2022Tomografia per emissió de positronsFotoelectroquímicaPositron emission tomographyPhotoelectrochemistryinfo:eu-repo/semantics/article7282632024-07-02info:eu-repo/semantics/openAccess