Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/10915
Title: Size effect on current fluctuations in thin metal films: Monte Carlo approach
Author: Bulashenko, Oleg
Kochelap, O. V.
Kochelap, V. A.(Viacheslav Aleksandrovich)
Keywords: Pel·lícules metàl·liques
Mètode de Montecarlo
Metallic films
Monte Carlo method
Issue Date: 1992
Publisher: The American Physical Society
Abstract: Current fluctuations associated with the classical size effect, for which the mean free path of the carriers λ is comparable to, or greater than, the film thickness d, have been investigated. The Monte Carlo approach has been extended into the Knudsen regime of electron transport. Using this method, the autocorrelation function and the spectral density of the fluctuations depending on two parameters (the ratio γ=λ/d and the surface specularity p) have been calculated. A procedure to generate the angle of diffuse electron scattering at the surface is described for both the Fuchs and the Soffer boundary conditions. It is demonstrated for both models that, with increasing γ and with decreasing p, the low-frequency noise is suppressed, with a redistribution toward higher frequencies. In such a case, the autocorrelation function is not exponential and the corresponding spectral density of the fluctuations is no longer Lorentzian.
Note: Reproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.45.14308
It is part of: Physical Review B, 1992, vol. 45, núm. 24, p. 14308-14314
Related resource: https://doi.org/10.1103/PhysRevB.45.14308
URI: http://hdl.handle.net/2445/10915
ISSN: 0163-1829
Appears in Collections:Articles publicats en revistes (Física de la Matèria Condensada)

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