Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/113042
Title: Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
Author: Botaya Turón, Luis
Coromina, Xavier
Samitier i Martí, Josep
Puig i Vidal, Manuel
Otero Díaz, Jorge
Keywords: Microscòpia d'efecte túnel
Impedància (Electricitat)
Quars
Scanning tunneling microscopy
Impedance (Electricity)
Quartz
Issue Date: 25-May-2016
Publisher: MDPI
Abstract: Here we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QTF sensor. Shear forces acting in the probe are measured to control the tip-sample distance in the Z direction. Moreover, the tilting of the tip allows the visualization of the experiment under the optical microscope, allowing the coordination of the probes in X and Y directions. Meanwhile, the metallic tips are connected to a current-voltage amplifier circuit to measure the currents and thus the impedance of the studied samples. We discuss here the different aspects that must be addressedwhenconductingthesemultiprobeexperiments,suchastheamplitudeofoscillation,shear force distance control, and wire tilting. Different results obtained in the measurement of calibration samples and microparticles are presented. They demonstrate the feasibility of the system to measure the impedance of the samples with a full 3D control on the position of the nanotips.
Note: Reproducció del document publicat a: https://doi.org/10.3390/s16060757
It is part of: Sensors, 2016, vol. 16, num. 6, p. 757
Related resource: https://doi.org/10.3390/s16060757
URI: http://hdl.handle.net/2445/113042
ISSN: 1424-8220
Appears in Collections:Articles publicats en revistes (Institut de Bioenginyeria de Catalunya (IBEC))
Articles publicats en revistes (Electrònica)

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