Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/13281
Title: Depth profile of uncompensated spins in an exchange bias system
Author: Roy, S.
Fitzsimmons, M. R.
Park, S.
Dorn, M.
Petracic, Oleg
Roshchin, Igor V.
Li, Zhi-Pan
Batlle Gelabert, Xavier
Morales, R.
Misra, A.
Zhang, Xixiang
Chesnel K.
Kortright, J. B.
Sinha, S. K.
Schuller, Ivan K.
Keywords: Materials
Propietats magnètiques
Cristal·lografia
Magnetic properties and materials
Crystallography
Issue Date: 2005
Publisher: American Physical Society
Abstract: We have used the unique spatial sensitivity of polarized neutron and soft x-ray beams in reflection geometry to measure the depth dependence of magnetization across the interface between a ferromagnet and an antiferromagnet. The net uncompensated magnetization near the interface responds to applied field, while uncompensated spins in the antiferromagnet bulk are pinned, thus providing a means to establish exchange bias.
Note: Reproducció digital del document proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevLett.95.047201
It is part of: Physical Review Letters, 2005, vol. 95, núm. 4,p. 047201-1-047201-4
URI: http://hdl.handle.net/2445/13281
ISSN: 0031-9007
Appears in Collections:Articles publicats en revistes (Física de la Matèria Condensada)

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