Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/24296
Title: Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization
Author: Sancho i Parramon, Jordi
Ferré Borrull, Josep
Bosch i Puig, Salvador
Ferrara, Maria Christina
Keywords: Òptica electrònica
Electron optics
Issue Date: 2003
Publisher: Optical Society of America
Abstract: We present a procedure for the optical characterization of thin-film stacks from spectrophotometric data. The procedure overcomes the intrinsic limitations arising in the numerical determination of many parameters from reflectance or transmittance spectra measurements. The key point is to use all the information available from the manufacturing process in a single global optimization process. The method is illustrated by a case study of solgel applications.
Note: Reproducció del document publicat a: http://dx.doi.org/10.1364/AO.42.001325
It is part of: Applied Optics, 2004, vol. 42, núm. 7, p. 1325-1329
Related resource: http://dx.doi.org/10.1364/AO.42.001325
URI: http://hdl.handle.net/2445/24296
ISSN: 0003-6935
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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