Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/24725
Title: Strain, alloy composition, and lattice relaxation measured by optical-absorption spectroscopy
Author: Clark, S. A.
Roura Grabulosa, Pere
Bosch Estrada, José
Pérez Rodríguez, Alejandro
Morante i Lleonart, Joan Ramon
Westwood, David I.
Williams, R. H.
Keywords: Propietats òptiques
Espectroscòpia
Optical properties
Spectrum analysis
Issue Date: 1-Apr-1995
Publisher: American Institute of Physics
Abstract: The validity of optical absorption (OA) as a technique for the measurement of strain e11, alloy composition x, and relaxation in InxGa1−xAs epilayers on InP has been examined by comparison with similar measurements by double‐crystal x‐ray diffraction (DCXD). Provided that the strain arising from differences in the thermal contraction of the substrate and epilayer are taken into account, measurements of strain by OA show good agreement with DCXD results, with a dispersion of Δe11=±0.27×10−3. Comparison of alloy compositions given by the two techniques shows similarly good agreement, with a dispersion in the values of x of less than Δx=±0.7%. OA may also be used to determine lattice relaxation. The degree of uncertainty in the measurement of this parameter increases as lattice match is approached and decreases as the lattice relaxes. Our studies indicate that OA may be used as an independent technique to evaluate strain, alloy composition, and the degree of lattice relaxation in InxGa1−xAs epilayers.
Note: Reproducció del document publicat a: http://dx.doi.org/10.1063/1.358629
It is part of: Journal of Applied Physics, 1995, vol. 77, núm. 7, p. 3393-3398
Related resource: http://dx.doi.org/10.1063/1.358629
URI: http://hdl.handle.net/2445/24725
ISSN: 0021-8979
Appears in Collections:Articles publicats en revistes (Electrònica)

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