Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/25058
Title: Phase-modulated ellipsometer using a Fourier transform infrared spectrometer for real time applications
Author: Canillas i Biosca, Adolf
Pascual Miralles, Esther
Drévillon, B.
Keywords: El·lipsometria
Fourier transformations
Espectroscòpia infraroja
Pel·lícules fines
Ellipsometry
Fourier transformations
Infrared spectroscopy
Thin films
Issue Date: Aug-1993
Publisher: American Institute of Physics
Abstract: A new Fourier transform infrared phase‐modulated ellipsometer is presented. It combines the high frequency provided by a photoelastic modulator (37 kHz) with the low frequency of the Fourier transform infrared spectroscopy (<1 kHz), by means of a numerical data acquisition system. A full spectrum recording (from 900 to 4000 cm−1) can be achieved in 2 s. Thus, it allows its adaptation for kinetic in situ studies. The optical setup and the data reduction procedure are presented. In particular, a self‐consistent spectral calibration procedure is described in detail. The precision in Ψ and Δ increases from 0.3° to 0.02° when increasing the integration time from 2 to 760 s. The examples shown in this article illustrate the high sensitivity to identify and analyze the absorption vibration variations of ultrathin films (a few angstroms thick).
Note: Reproducció del document publicat a: http://dx.doi.org/10.1063/1.1143953
It is part of: Review of Scientific Instruments, 1993, vol. 64, num. 8, p. 2153-2159
Related resource: http://dx.doi.org/10.1063/1.1143953
URI: http://hdl.handle.net/2445/25058
ISSN: 0034-6748
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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