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|Title:||Surface roughness in InGaAs Channels of HEMT devices depending on the growth temperature: strain induced or due to alloy decomposition|
Cornet i Calveras, Albert
Morante i Lleonart, Joan Ramon
Py, M. A.
|Publisher:||American Institute of Physics|
|Abstract:||InAlAs/InGaAs/InP based high electron mobility transistor devices have been structurally and electrically characterized, using transmission electron microscopy and Raman spectroscopy and measuring Hall mobilities. The InGaAs lattice matched channels, with an In molar fraction of 53%, grown at temperatures lower than 530¿°C exhibit alloy decomposition driving an anisotropic InGaAs surface roughness oriented along [1math0]. Conversely, lattice mismatched channels with an In molar fraction of 75% do not present this lateral decomposition but a strain induced roughness, with higher strength as the channel growth temperature increases beyond 490¿°C. In both cases the presence of the roughness implies low and anisotropic Hall mobilities of the two dimensional electron gas.|
|Note:||Reproducció del document publicat a: http://dx.doi.org/10.1063/1.367517|
|It is part of:||Journal of Applied Physics, 1998, vol. 83, núm. 12, p. 7537-7541|
|Appears in Collections:||Articles publicats en revistes (Electrònica)|
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