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http://hdl.handle.net/2445/47604| Title: | Infrared characterization of a-Si:H/a-Si1-xCx:H interfaces |
| Author: | Bertomeu i Balagueró, Joan Puigdollers i González, Joaquim Asensi López, José Miguel Andreu i Batallé, Jordi |
| Keywords: | Espectroscòpia infraroja Pel·lícules fines Hidrogen Semiconductors amorfs Porositat Infrared spectroscopy Thin films Hydrogen Amorphous semiconductors Porosity |
| Issue Date: | 1997 |
| Publisher: | Elsevier B.V. |
| Abstract: | Infrared spectroscopy was used to characterize three series of a-Si:H/a-Si1-xCx:H multilayers in which their geometrical parameters were varied. The infrared active vibrational groups in their spectra and the interference fringes in their absorption-free zone were studied to analyze the interfaces and the changes that are produced in very thin layers. Our results show that hydrogen is bonded to silicon only in monohydride groups. No additional hydrogen could be detected at these interfaces. The deposition of very thin a-Si1-xCx:H layers seems to affect their porous structure, making them denser. |
| Note: | Versió postprint del document publicat a: http://dx.doi.org/10.1016/S0169-4332(96)00600-9 |
| It is part of: | Applied Surface Science, 1997, vol. 108, num. 2, p. 211-217 |
| URI: | http://hdl.handle.net/2445/47604 |
| Related resource: | http://dx.doi.org/10.1016/S0169-4332(96)00600-9 |
| ISSN: | 0169-4332 |
| Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
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|---|---|---|---|---|
| 113130.pdf | 518.37 kB | Adobe PDF | View/Open |
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