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| Issue Date | Title | Author(s) |
|---|---|---|
| 2001 | Analysis of bias stress on thin-film transistors obtained by Hot-Wire Chemical Vapour Deposition | Dosev, D.; Puigdollers i González, Joaquim; Orpella, Albert; Voz Sánchez, Cristóbal; Fonrodona Turon, Marta; Soler Vilamitjana, David; Marsal Garví, Lluís F. (Lluís Francesc); Pallarés Curto, Jordi; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Alcubilla González, Ramón |
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- 1 2001