Browsing by Author Wirtz, Tom

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Issue DateTitleAuthor(s)
28-Jun-2016In-situ isotopic analysis at nanoscale using parallel ion electron spectrometry: a powerful new paradigm for correlative microscopyYedra Cardona, Lluís; Eswara, Santhana; Dowsett, David; Wirtz, Tom
9-Feb-2021Patterning enhanced tetragonality in BiFeO3 thin films with effective negative pressure by helium implantationToulouse, Constance; Fischer, J.; Farokhipoor, S.; Yedra Cardona, Lluís; Carlá, Francesco; Jarnac, A.; Elkaim, E.; Fertey, P.; Audinot, J.-N.; Wirtz, Tom; Noheda, B.; Garcia, V.; Fusil, S.; Peral Alonso, I.; Guennou, M.; Kreisel, J.