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Title: Shot noise in linear macroscopic resistors
Author: Gomila Lluch, Gabriel
Pennetta, C.
Reggiani, L. (Lino), 1941-
Ferrari, G.
Sampietro, M.
Bertuccio, G.
Keywords: Enginyeria elèctrica
Electric engineering
Issue Date: 2004
Publisher: American Physical Society
Abstract: We report on direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. The present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.
Note: Reproducció digital del document publicat en format paper, proporcionada per PROLA i
It is part of: Physical Review Letters, 2004, vol. 92, núm. 22, p. 226601-1-226601-4
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ISSN: 0031-9007
Appears in Collections:Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)

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