Please use this identifier to cite or link to this item:
https://hdl.handle.net/2445/13281
Title: | Depth profile of uncompensated spins in an exchange bias system |
Author: | Roy, S. Fitzsimmons, M. R. Park, S. Dorn, M. Petracic, Oleg Roshchin, Igor V. Li, Zhi-Pan Batlle Gelabert, Xavier Morales, R. Misra, A. Zhang, Xixiang Chesnel K. Kortright, J. B. Sinha, S. K. Schuller, Ivan K. |
Keywords: | Materials Propietats magnètiques Cristal·lografia Magnetic properties and materials Crystallography |
Issue Date: | 2005 |
Publisher: | American Physical Society |
Abstract: | We have used the unique spatial sensitivity of polarized neutron and soft x-ray beams in reflection geometry to measure the depth dependence of magnetization across the interface between a ferromagnet and an antiferromagnet. The net uncompensated magnetization near the interface responds to applied field, while uncompensated spins in the antiferromagnet bulk are pinned, thus providing a means to establish exchange bias. |
Note: | Reproducció digital del document proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevLett.95.047201 |
It is part of: | Physical Review Letters, 2005, vol. 95, núm. 4,p. 047201-1-047201-4 |
URI: | https://hdl.handle.net/2445/13281 |
Related resource: | http://dx.doi.org/10.1103/PhysRevLett.95.047201 |
ISSN: | 0031-9007 |
Appears in Collections: | Articles publicats en revistes (Física de la Matèria Condensada) |
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