Please use this identifier to cite or link to this item:
https://hdl.handle.net/2445/216517
Title: | End‐to‐end image analysis pipeline for liquid‐phase electron microscopy |
Author: | Marchello, G. De Pace, C. Duro‐Castano, A. Battaglia, G. Ruiz‐Perez, Lorena |
Keywords: | Microscòpia electrònica de transmissió Microscòpia electrònica Transmission electron microscopy Electron microscopy |
Issue Date: | 9-Mar-2020 |
Publisher: | Wiley |
Abstract: | Liquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and soft materials in their natural environment and offers the possibility of accessing their dynamic nature. Yet, the electron beam scattering from the windows and solvent increases the image noise and blur. Herein, we propose a pipeline to both de-noise and sharpen images obtained by liquid transmission electron microscopy. We develop the workflow in a way that it does not require any human interference, nor introduce artefacts, but actually unveils features of the imaged samples covered by the noise and the blur. |
Note: | Reproducció del document publicat a: https://doi.org/10.1111/jmi.12889 |
It is part of: | Journal of Microscopy-Oxford, 2020, vol. 279, num.3, p. 242-248 |
URI: | https://hdl.handle.net/2445/216517 |
Related resource: | https://doi.org/10.1111/jmi.12889 |
ISSN: | 0022-2720 |
Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
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File | Description | Size | Format | |
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870030.pdf | 3.42 MB | Adobe PDF | View/Open |
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