Please use this identifier to cite or link to this item:
https://hdl.handle.net/2445/220429
Title: | Calibration of achromatic Fresnel rhombs with an elliptical retarder model in Mueller matrix ellipsometers |
Author: | Bian, Subiao Xu, Xipeng Cui, Changcai Arteaga Barriel, Oriol |
Keywords: | El·lipsometria Operadors el·líptics Interferometria Ellipsometry Elliptic operator Interferometry |
Issue Date: | 2022 |
Publisher: | Elsevier B.V. |
Abstract: | Fresnel rhombs are the most achromatic form of retarders available and they are suitable compensating elements for spectroscopic Mueller matrix ellipsometers. However, the small stress in the rhomb caused by the mount or produced during the fabrication can affect the ellipsometry measurements with non-negligible systematic errors, due to the relatively long path length of light inside the rhomb. This work describes a calibration method that considers the non-ideal response of the Fresnel rhomb, and that it is especially well suited for calibrating Mueller matrix ellipsometers. The method describes each rhomb as the most general form of an elliptical retarder with a small ellipticity, instead of simply assuming that they behave as linear retarders.After this calibration, we show that the systematic errors of measurements are significantly decreased. |
Note: | Versió postprint del document publicat a: https://doi.org/10.1016/j.tsf.2022.139581 |
It is part of: | Thin Solid Films, 2022, vol. 763 |
URI: | https://hdl.handle.net/2445/220429 |
Related resource: | https://doi.org/10.1016/j.tsf.2022.139581 |
ISSN: | 0040-6090 |
Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
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