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http://hdl.handle.net/2445/32145
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DC Field | Value | Language |
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dc.contributor.author | Portillo i Serra, Joaquim | - |
dc.date.accessioned | 2012-09-28T14:05:24Z | - |
dc.date.available | 2012-09-28T14:05:24Z | - |
dc.date.issued | 2012 | - |
dc.identifier.uri | http://hdl.handle.net/2445/32145 | - |
dc.description | Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166 | - |
dc.description.abstract | Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times. | eng |
dc.format.extent | 10 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | eng |
dc.publisher | Centres Científics i Tecnològics. Universitat de Barcelona | cat |
dc.relation.isformatof | Reproducció del document original | - |
dc.relation.ispartof | Capítol del llibre: Handbook of instrumental techniques for materials, chemical and biosciences research, Centres Científics i Tecnològics. Universitat de Barcelona, Barcelona, 2012. Part I. Materials technologies (MT), MT.3, 10 p. | - |
dc.relation.uri | http://hdl.handle.net/2445/32166 | - |
dc.rights | (c) Universitat de Barcelona, 2012 | - |
dc.source | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) | - |
dc.subject.classification | Microscòpia electrònica de transmissió | cat |
dc.subject.classification | Anàlisi instrumental | cat |
dc.subject.classification | Difracció d'electrons | cat |
dc.subject.other | Transmission electron microscopy | eng |
dc.subject.other | Instrumental analysis | eng |
dc.subject.other | Electrons diffraction | eng |
dc.title | Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping | eng |
dc.type | info:eu-repo/semantics/bookPart | eng |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | eng |
Appears in Collections: | Llibres / Capítols de llibre (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) |
Files in This Item:
File | Description | Size | Format | |
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MT03 - Precession Electron Diffraction _ed2.pdf | 1.56 MB | Adobe PDF | View/Open |
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