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http://hdl.handle.net/2445/32222
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DC Field | Value | Language |
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dc.contributor.author | Peiró Martínez, Francisca | - |
dc.contributor.author | Cornet i Calveras, Albert | - |
dc.contributor.author | Herms Berenguer, Atilà | - |
dc.contributor.author | Morante i Lleonart, Joan Ramon | - |
dc.contributor.author | Clark, S. A. | - |
dc.contributor.author | Williams, R. H. | - |
dc.date.accessioned | 2012-10-08T12:58:36Z | - |
dc.date.available | 2012-10-08T12:58:36Z | - |
dc.date.issued | 1993 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/2445/32222 | - |
dc.description.abstract | This work is focused on the study of the fine speckle contrast present in planar view observations of matched and mismatched InGaAs layers grown by molecular beam epitaxy on InP substrates. Our results provide experimental evidence of the evolution of this fine structure with the mismatch, layer thickness, and growth temperature. The correlation of the influence of all these parameters on the appearance of the contrast modulation points to the development of the fine structure during the growth. Moreover, as growth proceeds, this structure shows a dynamic behavior which depends on the intrinsic layer substrate stress. | - |
dc.format.extent | 5 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | American Institute of Physics | - |
dc.relation.isformatof | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.352815 | - |
dc.relation.ispartof | Journal of Applied Physics, 1993, vol. 73, num. 9, p. 4319-4323 | - |
dc.relation.uri | http://dx.doi.org/10.1063/1.352815 | - |
dc.rights | (c) American Institute of Physics , 1993 | - |
dc.source | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) | - |
dc.subject.classification | Pel·lícules fines | - |
dc.subject.classification | Feixos moleculars | - |
dc.subject.classification | Nanotecnologia | - |
dc.subject.other | Thin films | - |
dc.subject.other | Molecular beams | - |
dc.subject.other | Nanotechnology | - |
dc.title | Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature | eng |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.identifier.idgrec | 071215 | - |
dc.date.updated | 2012-10-08T12:58:36Z | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
File | Description | Size | Format | |
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071215.pdf | 991.3 kB | Adobe PDF | View/Open |
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