Please use this identifier to cite or link to this item:
http://hdl.handle.net/2445/66840
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gonzalez Claramonte, Laura | - |
dc.contributor.author | Martínez-Martín, David | - |
dc.contributor.author | Otero Díaz, Jorge | - |
dc.contributor.author | José de Pablo, Pedro | - |
dc.contributor.author | Puig i Vidal, Manuel | - |
dc.contributor.author | Gómez-Herrero, Julio | - |
dc.date.accessioned | 2015-09-08T09:59:47Z | - |
dc.date.available | 2015-09-08T09:59:47Z | - |
dc.date.issued | 2015-01-14 | - |
dc.identifier.issn | 1424-8220 | - |
dc.identifier.uri | http://hdl.handle.net/2445/66840 | - |
dc.description.abstract | The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. | - |
dc.format.extent | 10 p. | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | MDPI | - |
dc.relation.isformatof | Reproducció del document publicat a: http://dx.doi.org/10.3390/s150101601 | - |
dc.relation.ispartof | Sensors, 2015, vol. 15, p. 1601-1610 | - |
dc.relation.uri | http://dx.doi.org/10.3390/s150101601 | - |
dc.rights | cc-by (c) Gonzalez Claramonte, Laura et al., 2015 | - |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/es | - |
dc.source | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) | - |
dc.subject.classification | Microscòpia de força atòmica | - |
dc.subject.classification | Microscòpia electrònica d'escombratge | - |
dc.subject.other | Atomic force microscopy | - |
dc.subject.other | Scanning electron microscopy | - |
dc.title | Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End | - |
dc.type | info:eu-repo/semantics/article | - |
dc.type | info:eu-repo/semantics/publishedVersion | - |
dc.identifier.idgrec | 650690 | - |
dc.date.updated | 2015-09-08T09:59:47Z | - |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | - |
dc.identifier.pmid | 25594596 | - |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
650690.pdf | 3.07 MB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License