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Title: | Improving the Lateral Resolution of Quartz Tuning Fork-Based Sensors in Liquid by Integrating Commercial AFM Tips into the Fiber End |
Author: | Gonzalez Claramonte, Laura Martínez-Martín, David Otero Díaz, Jorge José de Pablo, Pedro Puig i Vidal, Manuel Gómez-Herrero, Julio |
Keywords: | Microscòpia de força atòmica Microscòpia electrònica d'escombratge Atomic force microscopy Scanning electron microscopy |
Issue Date: | 14-Jan-2015 |
Publisher: | MDPI |
Abstract: | The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own. |
Note: | Reproducció del document publicat a: http://dx.doi.org/10.3390/s150101601 |
It is part of: | Sensors, 2015, vol. 15, p. 1601-1610 |
URI: | http://hdl.handle.net/2445/66840 |
Related resource: | http://dx.doi.org/10.3390/s150101601 |
ISSN: | 1424-8220 |
Appears in Collections: | Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
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