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| Issue Date | Title | Author(s) |
|---|---|---|
| 1996 | L'el·lipsometria, una eina de caracterització òptica dels materials | Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Pascual Miralles, Esther; Bertrán Serra, Enric |
| 15-Jun-2019 | Anisotropic integral decomposition of depolarizing Mueller matrices | Ossikovski, Razvigor; Kuntman, Mehmet Ali; Arteaga Barriel, Oriol |
| 29-Sep-2020 | Geometrical Phase Optical Components: Measuring Geometric Phase without Interferometry | Arteaga Barriel, Oriol; Bendada, Hana |
| 3-Apr-2017 | Optical security and authentication using nanoscale and thin-film structures | Carnicer González, Arturo; Javidi, Bahram |
| 3-Oct-2023 | Wide-field Mueller matrix polarimetry for spectral characterization of basic biological tissues: muscle, fat, connective tissue, and skin | Pardo, Iago; Bian, Subiao; Gomis-Brescó, Jordi; Pascual Miralles, Esther; Canillas i Biosca, Adolf; Bosch i Puig, Salvador; Arteaga Barriel, Oriol |
| 22-Oct-2015 | Optical security verification by synthesizing thin films with unique polarimetric signatures | Carnicer González, Arturo; Arteaga Barriel, Oriol; Pascual Miralles, Esther; Canillas i Biosca, Adolf; Vallmitjana i Rico, Santiago; Javidi, Bahram; Bertrán Serra, Enric |
| 17-Dec-2010 | Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry | Barroso, F.; Bosch i Puig, Salvador; Tort Escribà, Núria; Arteaga Barriel, Oriol; Sancho i Parramon, Jordi; Jover, Eric; Bertrán Serra, Enric; Canillas i Biosca, Adolf |
| 8-Dec-2008 | Low temperature back-surface-field contacts deposited by Hot-wire CVD for heterojunction solar cells | Muñoz Ramos, David; Voz Sánchez, Cristóbal; Martin Garcia, Isidro; Orpella, Albert; Alcubilla González, Ramón; Villar, Fernando; Bertomeu i Balagueró, Joan; Andreu i Batallé, Jordi; Roca i Cabarrocas, P. (Pere) |
| 2009 | Determination of the components of the gyration tensor of quartz by oblique incidence transmission two-modulator generalized ellipsometry | Arteaga Barriel, Oriol; Canillas i Biosca, Adolf; Jellison, Gerald E. |
| Aug-1993 | Phase-modulated ellipsometer using a Fourier transform infrared spectrometer for real time applications | Canillas i Biosca, Adolf; Pascual Miralles, Esther; Drévillon, B. |
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