Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/118511
Title: Optical security verification by synthesizing thin films with unique polarimetric signatures
Author: Carnicer González, Arturo
Arteaga Barriel, Oriol
Pascual Miralles, Esther
Canillas i Biosca, Adolf
Vallmitjana i Rico, Santiago
Javidi, Bahram
Bertran Serra, Enric
Keywords: Reconeixement òptic de formes
Xifratge (Informàtica)
Polarització (Llum)
El·lipsometria
Optical pattern recognition
Data encryption (Computer science)
Polarization (Light)
Ellipsometry
Issue Date: 22-Oct-2015
Publisher: Optical Society of America
Abstract: This letter reports the production and optical polarimetric verification of codes based on thin-film technology for security applications. Because thin-film structures display distinctive polarization signatures, this data is used to authenticate the message encoded. Samples are analyzed using an imaging ellipsometer able to measure the 16 components of the Mueller matrix. As a result, the behavior of the thin-film under polarized light becomes completely characterized. This information is utilized to distinguish among true and false codes by means of correlation. Without the imaging optics the components of the Mueller matrix become noise-like distributions and, consequently, the message encoded is no longer available. Then, a set of Stokes vectors are generated numerically for any polarization state of the illuminating beam and thus, machine learning techniques can be used to perform classification. We show that successful authentication is possible using the knearest neighbors algorithm in thin-films codes that have been anisotropically phase-encoded with pseudorandom phase code.
Note: Versió postprint del document publicat a: https://doi.org/10.1364/OL.40.005399
It is part of: Optics Letters, 2015, vol. 40, num. 22, p. 5399-5402
URI: http://hdl.handle.net/2445/118511
Related resource: https://doi.org/10.1364/OL.40.005399
ISSN: 0146-9592
Appears in Collections:Articles publicats en revistes (Física Aplicada)
Articles publicats en revistes (Institut de Nanociència i Nanotecnologia (IN2UB))

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