Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/124987
Title: Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films
Author: Coll Benejam, Catalina
López Conesa, Lluís
Rebled, J. M. (José Manuel)
Magén, César
Sánchez Barrera, Florencio
Fontcuberta i Griñó, Josep
Estradé Albiol, Sònia
Peiró Martínez, Francisca
Keywords: Pel·lícules fines
Thin films
Issue Date: 6-Apr-2017
Publisher: American Chemical Society
Abstract: LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images
Note: Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484
It is part of: Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304
URI: http://hdl.handle.net/2445/124987
Related resource: https://doi.org/10.1021/acs.jpcc.6b12484
ISSN: 1932-7447
Appears in Collections:Articles publicats en revistes (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB))
Articles publicats en revistes (Electrònica)

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