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https://hdl.handle.net/2445/124987| Title: | Simulation of STEM-HAADF image contrast of Ruddlesden-Popper faulted LaNiO<sub>3</sub> thin films |
| Author: | Coll Benejam, Catalina López Conesa, Lluís Rebled, J. M. (José Manuel) Magén, César Sánchez Barrera, Florencio Fontcuberta i Griñó, Josep Estradé Albiol, Sònia Peiró Martínez, Francisca |
| Keywords: | Pel·lícules fines Thin films |
| Issue Date: | 6-Apr-2017 |
| Publisher: | American Chemical Society |
| Abstract: | LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work we present a detailed structural characterization of epitaxial LNO thin films grown on LaAlO3(001). Based on scanning transmission electron microscope - high-angle annular darkfield imaging (STEM-HAADF) contrast analysis and image simulations, Ruddlesden-Popper faulted configurations, with 1/2a<111> relative displacement of defect free perovskite blocks, are atomically modeled and simulated to disentangle the variation of Z-contrast in the experimental images |
| Note: | Versió postprint del document publicat a: https://doi.org/10.1021/acs.jpcc.6b12484 |
| It is part of: | Journal of Physical Chemistry C, 2017, vol. 121, num. 17, p. 9300-9304 |
| URI: | https://hdl.handle.net/2445/124987 |
| Related resource: | https://doi.org/10.1021/acs.jpcc.6b12484 |
| ISSN: | 1932-7447 |
| Appears in Collections: | Articles publicats en revistes (Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)) Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
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