Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/128199
Title: Evidence of a minoritary monoclinic LaNiO<sub>2.5</sub> phase in lanthanum nickelate thin films
Author: López Conesa, Lluís
Rebled, J. M. (José Manuel)
Pesquera, David
Dix, Nico
Sánchez, Florencio
Herranz, Gervasi
Fontcuberta, Josep
Magén, César
Casanove, Marie Jose
Estradé Albiol, Sònia
Peiró Martínez, Francisca
Keywords: Ciència dels materials
Cristal·lografia
Pel·lícules fines
Òxids metàl·lics
Estructura electrònica
Materials science
Crystallography
Thin films
Metallic oxides
Electronic structure
Issue Date: 7-Mar-2017
Publisher: Royal Society of Chemistry
Abstract: LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied using Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films.
Note: Versió postprint del document publicat a: https://doi.org/10.1039/c7cp00902j
It is part of: Physical Chemistry Chemical Physics, 2017, vol. 19, num. 13, p. 9137-9142
URI: http://hdl.handle.net/2445/128199
Related resource: https://doi.org/10.1039/c7cp00902j
ISSN: 1463-9076
Appears in Collections:Articles publicats en revistes (Electrònica)
Articles publicats en revistes (Institut de Nanociència i Nanotecnologia (IN2UB))

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