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| Issue Date | Title | Author(s) |
|---|---|---|
| 1998 | Local noise analysis of a Schottky contact: combined thermionic-emissiondiffusion theory | Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel |
| 1998 | Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach | Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel; Kochelap, V. A. (Viacheslav Aleksandrovich) |
| 15-Jun-1998 | Surface roughness in InGaAs Channels of HEMT devices depending on the growth temperature: strain induced or due to alloy decomposition | Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon; Beck, M.; Py, M. A. |
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