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Issue DateTitleAuthor(s)
2009Current transport and electroluminescence mechanisms in thin SiO2 films containing Si nanocluster-sensitized erbium ions.Jambois, Olivier; Berencén Ramírez, Yonder Antonio; Hijazi, K.; Wojdak, M.; Kenyon, Anthony J.; Gourbilleau, Fabrice; Rizk, Richard; Garrido Fernández, Blas
2007Excitable Er fraction and quenching phenomena in Er-doped SiO2 layers containing Si nanoclustersGarrido Fernández, Blas; García Favrot, Cristina; Seo, S.-Y.; Pellegrino, Paolo; Navarro Urrios, Daniel; Daldosso, Nicola; Pavesi, Lorenzo; Gourbilleau, Fabrice; Rizk, Richard
8-Jul-2005Size dependence of refractive index of Si nanoclusters embedded in SiO2Moreno Pastor, José Antonio; Garrido Fernández, Blas; Pellegrino, Paolo; García Favrot, Cristina; Arbiol i Cobos, Jordi; Morante i Lleonart, Joan Ramon; Marie, P.; Gourbilleau, Fabrice; Rizk, Richard