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Issue Date | Title | Author(s) |
---|---|---|
Sep-2000 | Properties of nitrogen doped silicon films deposited by low-pressure chemical vapor deposition from silane and ammonia | Temple Boyer, Pierre; Jalabert, L.; Masarotto, L.; Alay, Josep Lluís; Morante i Lleonart, Joan Ramon |
2-Sep-2005 | Conduction mechanisms and charge storage in Si-nanocrystals metal-oxide-semiconductor memory devices studied with conducting atomic force microscopy | Porti i Pujal, Marc; Avidano, M.; Nafría i Maqueda, Montserrat; Aymerich Humet, Xavier; Carreras, Josep; Garrido Fernández, Blas |
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