Please use this identifier to cite or link to this item:
http://hdl.handle.net/2445/98783
Title: | Metal island film-based structures for sensing using spectrophotometry and ellipsometry |
Author: | Janicki, V. Sancho i Parramon, Jordi Bosch i Puig, Salvador Zorc, H. Belarre, F. J. Arbiol i Cobos, Jordi |
Keywords: | Ressonància de plasmons superficials Pel·lícules metàl·liques El·lipsometria Surface plasmon resonance Metallic films Ellipsometry |
Issue Date: | 2014 |
Publisher: | Springer Verlag |
Abstract: | Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements. |
Note: | Versió postprint del document publicat a: http://dx.doi.org/10.1007/s00339-013-8056-x |
It is part of: | Applied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486 |
URI: | http://hdl.handle.net/2445/98783 |
Related resource: | http://dx.doi.org/10.1007/s00339-013-8056-x |
ISSN: | 0947-8396 |
Appears in Collections: | Articles publicats en revistes (Física Aplicada) |
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File | Description | Size | Format | |
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629697.pdf | 531.42 kB | Adobe PDF | View/Open |
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