Please use this identifier to cite or link to this item: http://hdl.handle.net/2445/98783
Title: Metal island film-based structures for sensing using spectrophotometry and ellipsometry
Author: Janicki, V.
Sancho i Parramon, Jordi
Bosch i Puig, Salvador
Zorc, H.
Belarre, F. J.
Arbiol i Cobos, Jordi
Keywords: Ressonància de plasmons superficials
Pel·lícules metàl·liques
El·lipsometria
Surface plasmon resonance
Metallic films
Ellipsometry
Issue Date: 2014
Publisher: Springer Verlag
Abstract: Metal island films (MIF) are good candidates for sensors due to the strong sensitivity of the localised surface plasmon resonance to the environment refractive index. The strong near field enhancement in the vicinity of the island surface can be even higher if a metal layer (ML) is placed close to a MIF. Structures containing MIF with and without ML are prepared and sensitivities of spectrophotometric and ellipsometric features of the measurements are compared. It is shown that simple MIF is preferable for ellipsometry-based sensing and the one including ML in the case of spectrophotometric measurements.
Note: Versió postprint del document publicat a: http://dx.doi.org/10.1007/s00339-013-8056-x
It is part of: Applied Physics A-Materials Science & Processing, 2014, vol. 115, num. 2, p. 481-486
Related resource: http://dx.doi.org/10.1007/s00339-013-8056-x
URI: http://hdl.handle.net/2445/98783
ISSN: 0947-8396
Appears in Collections:Articles publicats en revistes (Física Aplicada)

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