Fitxers
Tipus de document
ArticleVersió
Versió publicadaData de publicació
Tots els drets reservats
Si us plau utilitzeu sempre aquest identificador per citar o enllaçar aquest document: https://hdl.handle.net/2445/10915
Size effect on current fluctuations in thin metal films: Monte Carlo approach
Títol de la revista
Director/Tutor
ISSN de la revista
Títol del volum
Recurs relacionat
Resum
Current fluctuations associated with the classical size effect, for which the mean free path of the carriers λ is comparable to, or greater than, the film thickness d, have been investigated. The Monte Carlo approach has been extended into the Knudsen regime of electron transport. Using this method, the autocorrelation function and the spectral density of the fluctuations depending on two parameters (the ratio γ=λ/d and the surface specularity p) have been calculated. A procedure to generate the angle of diffuse electron scattering at the surface is described for both the Fuchs and the Soffer boundary conditions. It is demonstrated for both models that, with increasing γ and with decreasing p, the low-frequency noise is suppressed, with a redistribution toward higher frequencies. In such a case, the autocorrelation function is not exponential and the corresponding spectral density of the fluctuations is no longer Lorentzian.
Matèries (anglès)
Citació
Citació
BULASHENKO, Oleg, KOCHELAP, O. V. and KOCHELAP, V. A. (Viacheslav Aleksandrovich). Size effect on current fluctuations in thin metal films: Monte Carlo approach. Physical Review B. 1992. Vol. 45, num. 24, pags. 14308-14314. ISSN 0163-1829. [consulted: 8 of August of 2026]. Available at: https://hdl.handle.net/2445/10915