Polarized Raman scattering study of kesterite type Cu2ZnSnS4 single crystals

dc.contributor.authorGuc, Maxim
dc.contributor.authorLevcenko, Sergiu
dc.contributor.authorBodnar, Ivan V.
dc.contributor.authorIzquierdo Roca, Victor
dc.contributor.authorFontané Sánchez, Xavier
dc.contributor.authorVolkova, Larisa V.
dc.contributor.authorArushanov, Ernest
dc.contributor.authorPérez Rodríguez, Alejandro
dc.date.accessioned2017-07-14T14:43:05Z
dc.date.available2017-07-14T14:43:05Z
dc.date.issued2016
dc.date.updated2017-07-14T14:43:05Z
dc.description.abstractA non-destructive Raman spectroscopy has been widely used as a complimentary method to X-ray diffraction characterization of Cu2ZnSnS4 (CZTS) thin films, yet our knowledge of the Raman active fundamental modes in this material is far from complete. Focusing on polarized Raman spectroscopy provides important information about the relationship between Raman modes and CZTS crystal structure. In this framework the zone-center optical phonons of CZTS, which is most usually examined in active layers of the CZTS based solar cells, are studied by polarized resonant and non-resonant Raman spectroscopy in the range from 60 to 500 cm(-1) on an oriented single crystal. The phonon mode symmetry of 20 modes from the 27 possible vibrational modes of the kesterite structure is experimentally determined. From in-plane angular dependences of the phonon modes intensities Raman tensor elements are also derived. Whereas a strong intensity enhancement of the polar E and B symmetry modes is induced under resonance conditions, no mode intensity dependence on the incident and scattered light polarization configurations was found in these conditions. Finally, Lyddane-Sachs-Teller relations are applied to estimate the ratios of the static to high-frequency optic dielectric constants parallel and perpendicular to c-optical axis.
dc.format.extent7 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec660699
dc.identifier.issn2045-2322
dc.identifier.pmid26776727
dc.identifier.urihttps://hdl.handle.net/2445/113834
dc.language.isoeng
dc.publisherNature Publishing Group
dc.relation.isformatofReproducció del document publicat a: https://doi.org/10.1038/srep19414
dc.relation.ispartofScientific Reports, 2016, vol. 6, p. 19414
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/269167/EU//PVICOKEST
dc.relation.urihttps://doi.org/10.1038/srep19414
dc.rightscc-by (c) Guc, Maxim et al., 2016
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationEspectroscòpia Raman
dc.subject.classificationCristal·lografia
dc.subject.classificationPel·lícules fines
dc.subject.otherRaman spectroscopy
dc.subject.otherCrystallography
dc.subject.otherThin films
dc.titlePolarized Raman scattering study of kesterite type Cu2ZnSnS4 single crystals
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion

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