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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/10630

Impedance field and transition from thermal to shot noise in Cd1-xZnxTe semi-insulating Ohmic detectors

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Within a drift-diffusion model we investigate the role of the self-consistent electric field in determining the impedance field of a macroscopic Ohmic (linear) resistor made by a compensated semi-insulating semiconductor at arbitrary values of the applied voltage. The presence of long-range Coulomb correlations is found to be responsible for a reshaping of the spatial profile of the impedance field. This reshaping gives a null contribution to the macroscopic impedance but modifies essentially the transition from thermal to shot noise of a macroscopic linear resistor. Theoretical calculations explain a set of noise experiments carried out in semi-insulating CdZnTe detectors.

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ROSINI, M., REGGIANI, L. (Lino) and GOMILA LLUCH, Gabriel. Impedance field and transition from thermal to shot noise in Cd1-xZnxTe semi-insulating Ohmic detectors. Physical Review B. 2007. Vol. 75, num. 4, pags. 045209-1-045209-9. ISSN 0163-1829. [consulted: 6 of June of 2026]. Available at: https://hdl.handle.net/2445/10630

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