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Article

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Published version

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2014-04-01

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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/54287

Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation

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http://dx.doi.org/10.1364/AO.53.002236

Abstract

In this paper we describe a new Mueller matrix (MM) microscope that generalizes and makes quantitative the polarized light microscopy technique. In this instrument all the elements of the MU are simultaneously determined from the analysis in the frequency domain of the time-dependent intensity of the light beam at every pixel of the camera. The variations in intensity are created by the two compensators continuously rotating at different angular frequencies. A typical measurement is completed in a little over one minute and it can be applied to any visible wavelength. Some examples are presented to demonstrate the capabilities of the instrument.

Subject

El·lipsometria, Microscòpia

Subject (English)

Ellipsometry, Microscopy

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Articles publicats en revistes (Física Aplicada)

Citation

ARTEAGA BARRIEL, Oriol, et al. Mueller matrix microscope with a dual continuous rotating compensator setup and digital demodulation. Applied Optics. 2014. Vol. 53, num. 10, pags. 2236-2245. ISSN 1559-128X. [consulted: 9 of August of 2026]. Available at: https://hdl.handle.net/2445/54287

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