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Si us plau utilitzeu sempre aquest identificador per citar o enllaçar aquest document: https://hdl.handle.net/2445/48189
Finite Element Analysis of Electrically Excited Quartz Tuning Fork Devices
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Quartz Tuning Fork (QTF)-based Scanning Probe Microscopy (SPM) is an important field of research. A suitable model for the QTF is important to obtain quantitative measurements with these devices. Analytical models have the limitation of being based on the double cantilever configuration. In this paper, we present an electromechanical finite element model of the QTF electrically excited with two free prongs. The model goes beyond the state-of-the-art of numerical simulations currently found in the literature for this QTF configuration. We present the first numerical analysis of both the electrical and mechanical behavior of QTF devices. Experimental measurements obtained with 10 units of the same model of QTF validate the finite element model with a good agreement.
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ORIA, Roger, et al. Finite Element Analysis of Electrically Excited Quartz Tuning Fork Devices. Sensors. 2013. Vol. 13, num. 7156-7169. ISSN 1424-8220. [consulted: 14 of August of 2026]. Available at: https://hdl.handle.net/2445/48189