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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/8502
Statistics of transverse mode turn-on dynamics in VCSEL's
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The turn-on process of a multimode VCSEL is investigated from a statistical point of view. Special attention is paid to quantities such as time jitter and bit error rate. The single-mode performance of VCSEL¿s during current modulation is compared to that of edge-emitting lasers.
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DELLUNDE I CLAVÉ, Jaume, et al. Statistics of transverse mode turn-on dynamics in VCSEL's. IEEE Journal of Quantum Electronics. 1997. Vol. 33, num. 7, pags. 1197-1204. ISSN 0018-9197. [consulted: 9 of June of 2026]. Available at: https://hdl.handle.net/2445/8502