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Si us plau utilitzeu sempre aquest identificador per citar o enllaçar aquest document: https://hdl.handle.net/2445/177856
Nanoscale Tomography Based in Electrostatic Force Microscopy
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[eng] The ability to characterize the elements beneath the surface has been a dire necessity in the fields of materials science, polymer technology, biology, and medical sciences. Scanning Probe Microscopies are the family of microscopies that scans the surface using a nanometric probe and the acquired data is used to reconstruct the physical properties of the samples in nanometric resolution (e.g., topography). Since the measurements could be carried out in non-contact mode, the ability to study tomography have made them a better contender. SPM also possess the relative advantage of being non-invasive, non-destructive, requires relatively minimal sample preparation, can be extended into any environment (inert, ambient vacuum), and also be measured in air, water, or any biological medium. Among them, Electrostatic Force Microscopy, has been successfully used in subsurface investigations to study the compositional modifications below the organic layers, imaging below the organic layers, imaging water molecules in confined nanometric channels, imaging of carbon nanotubes, graphene networks and nanoparticles inside the polymeric nanocomposites. Nanocomposites, which consist of nanostructures in their bulk matrix to improve the matrix efficiency, have been one of the successfully incorporated material science application of the last two decades. Silver nanoparticle especially have a barrage of applications to its credit ranging from solar cell applications, touch screens, LEDs to flexible wearable devices. Understanding the subsurface features or tomography of these nanocomposites could help us in understanding their properties, interpreting them based on their parametric dependence which would later aid us in tuning them for our desired applications. In this thesis. Individual computational studies have been carried out of nanowires buried in a dielectric matrix to observe the effects of various parameters influencing the subsurface imaging. Spatial resolution is given prime importance as its behavior of two parallel nanowires is studied along with two nanowires overlapped one on top of each other. Also, the analysis of silver nanowire nanocomposites has been investigated with the help of Scanning Dielectric Force Volume Microscopy, a technique proposed recently with EFM. The bulk matrix is composed of gelatin which can offer a range of permittivities depending on the degree of hydration, for e.g., here εr ~ 5 to εr ~ 14 . This sample is experimentally analyzed, imaged and the depth of nanowires in the matrix inside the bulk matrix is mapped with the theoretical analysis. This thesis research provides us with subsurface information that would help us in understanding and tuning the parameters to achieve desired applications.
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BALAKISHAN, Harishankar. Nanoscale Tomography Based in Electrostatic Force Microscopy. [consulta: 12 de desembre de 2025]. [Disponible a: https://hdl.handle.net/2445/177856]