Optimized back-focal-plane interferometry directly measures forces of optically trapped particles

dc.contributor.authorFarré Flaquer, Arnau
dc.contributor.authorMarsà, Ferran
dc.contributor.authorMontes Usategui, Mario
dc.date.accessioned2014-03-24T12:22:34Z
dc.date.available2014-03-24T12:22:34Z
dc.date.issued2012-05-21
dc.date.updated2014-03-24T12:22:34Z
dc.description.abstractBack-focal-plane interferometry is used to measure displacements of optically trapped samples with very high spatial and temporal resolution. However, the technique is closely related to a method that measures the rate of change in light momentum. It has long been known that displacements of the interference pattern at the back focal plane may be used to track the optical force directly, provided that a considerable fraction of the light is effectively monitored. Nonetheless, the practical application of this idea has been limited to counter-propagating, low-aperture beams where the accurate momentum measurements are possible. Here, we experimentally show that the connection can be extended to single-beam optical traps. In particular, we show that, in a gradient trap, the calibration product κ·β (where κ is the trap stiffness and 1/β is the position sensitivity) corresponds to the factor that converts detector signals into momentum changes; this factor is uniquely determined by three construction features of the detection instrument and does not depend, therefore, on the specific conditions of the experiment. Then, we find that force measurements obtained from back-focal-plane displacements are in practice not restricted to a linear relationship with position and hence they can be extended outside that regime. Finally, and more importantly, we show that these properties are still recognizable even when the system is not fully optimized for light collection. These results should enable a more general use of back-focal-plane interferometry whenever the ultimate goal is the measurement of the forces exerted by an optical trap.
dc.format.extent22 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec614580
dc.identifier.issn1094-4087
dc.identifier.pmid22714216
dc.identifier.urihttps://hdl.handle.net/2445/52852
dc.language.isoeng
dc.publisherOptical Society of America
dc.relation.isformatofReproducció del document publicat a: http://dx.doi.org/10.1364/OE.20.012270
dc.relation.ispartofOptics Express, 2012, vol. 20, num. 11, p. 12270-12291
dc.relation.urihttp://dx.doi.org/10.1364/OE.20.012270
dc.rights(c) Optical Society of America, 2012
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Física Aplicada)
dc.subject.classificationInterferometria
dc.subject.classificationPiezoelectricitat
dc.subject.classificationLàsers
dc.subject.classificationInstruments òptics
dc.subject.otherInterferometry
dc.subject.otherPiezoelectricity
dc.subject.otherLasers
dc.subject.otherOptical instruments
dc.titleOptimized back-focal-plane interferometry directly measures forces of optically trapped particles
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion

Fitxers

Paquet original

Mostrant 1 - 1 de 1
Carregant...
Miniatura
Nom:
614580.pdf
Mida:
4.08 MB
Format:
Adobe Portable Document Format