Automated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte‐Gated Organic Transistors

dc.contributor.authorTanwar, Shubham
dc.contributor.authorMillán Solsona, Rubén
dc.contributor.authorRuiz‐Molina, Sara
dc.contributor.authorMas Torrent, Marta
dc.contributor.authorKyndiah, Adrica
dc.contributor.authorGomila Lluch, Gabriel
dc.date.accessioned2025-05-05T17:10:41Z
dc.date.available2025-05-05T17:10:41Z
dc.date.issued2024-11-01
dc.date.updated2025-05-05T17:10:41Z
dc.description.abstractElectrolyte-gated organic transistors (EGOTs) leveraging organic semiconductors' electronic and ionic transport characteristics are the key enablers for many biosensing and bioelectronic applications that can selectively sense, record, and monitor different biological and biochemical processes at the nanoscale and translate them into macroscopic electrical signals. Understanding such transduction mechanisms requires multiscale characterization tools to comprehensively probe local electrical properties and link them with device behavior across various bias points. Here, an automated scanning dielectric microscopy toolbox is demonstrated that performs operando in-liquid scanning dielectric microscopy measurements on functional EGOTs and carries out extensive data analysis to unravel the evolution of local electrical properties in minute detail. This paper emphasizes critical experimental considerations permitting standardized, accurate, and reproducible data acquisition. The developed approach is validated with EGOTs based on blends of organic small molecule semiconductor and insulating polymer that work as accumulation-mode field-effect transistors. Furthermore, the degradation of local electrical characteristics at high gate voltages is probed, which is apparently driven by the destruction of local crystalline order due to undesirable electrochemical swelling of the organic semiconducting material near the source electrode edge. The developed approach paves the way for systematic probing of EGOT-based technologies for targeted optimization and fundamental understanding.
dc.format.extent1 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec754215
dc.identifier.issn2199-160X
dc.identifier.urihttps://hdl.handle.net/2445/220828
dc.language.isoeng
dc.publisherWiley-VCH
dc.relation.isformatofVersió postprint del document publicat a: https://doi.org/https://doi.org/10.1002/aelm.202400222
dc.relation.ispartofAdvanced Electronic Materials, 2024, vol. 10, num.11
dc.relation.urihttps://doi.org/https://doi.org/10.1002/aelm.202400222
dc.rights(c) Wiley-VCH, 2024
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationElectroquímica
dc.subject.classificationSemiconductors orgànics
dc.subject.classificationElectròlits
dc.subject.otherElectrochemistry
dc.subject.otherOrganic semiconductors
dc.subject.otherElectrolytes
dc.titleAutomated Scanning Dielectric Microscopy Toolbox for Operando Nanoscale Electrical Characterization of Electrolyte‐Gated Organic Transistors
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion

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