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Treball de fi de grau

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cc-by-nc-nd (c) Deco, 2019
Si us plau utilitzeu sempre aquest identificador per citar o enllaçar aquest document: https://hdl.handle.net/2445/141107

Crystallographic characterization of a BFMO layer grown on STO through HRTEM imaging and simulation

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Bi(Fe0.5Mn0.5)O3 is a multiferroic material with electric and magnetic properties of great interest for potential spintronic applications. To understand what triggers its peculiar behaviour it is essential to know its structure, and for that, TEM is the ideal tool for analysis at the nanoscale. The aim is to study a thin film of BFMO grown on a STO substrate through the analysis of high resolution transmission electron microscopy (HREM) images and the use of HREM simulations from theoretical atomistic models built also in this project. The results show that this method can lead to useful results in structure determination of a material

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Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2019, Tutores: Francesca Peiró Martínez, Catalina Coll Benejam

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DECO, Nikolas. Crystallographic characterization of a BFMO layer grown on STO through HRTEM imaging and simulation. [consulta: 23 de gener de 2026]. [Disponible a: https://hdl.handle.net/2445/141107]

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