Mueller Matrix Microscopy

dc.contributor.advisor	Arteaga Barriel, Oriol
dc.contributor.author	Baldrís Calmet, Marta
dc.date.accessioned	2014-11-18T09:39:46Z
dc.date.available	2014-11-18T09:39:46Z
dc.date.issued	2014-01
dc.description	Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Any: 2014, Tutor: Oriol Arteaga	ca
dc.description.abstract	We describe a microscope that can measure simultaneously all the Mueller matrix elements of a sample with high spatial resolution. This measure is possible thanks to the dual rotating compensator method, which analyses the variation in time of the intensity at every pixel of the camera detector. This work reports the measurement principle, the instrumental details, the calibration, and some applications of the microscope.	ca
dc.format.extent	5 p.
dc.format.mimetype	application/pdf
dc.identifier.uri	https://hdl.handle.net/2445/59746
dc.language.iso	eng	ca
dc.rights	cc-by-nc-nd (c) Baldrís Calmet, 2014
dc.rights.accessRights	info:eu-repo/semantics/openAccess	ca
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.source	Treballs Finals de Grau (TFG) - Física
dc.subject.classification	Anisotropia	cat
dc.subject.classification	Microscòpia	cat
dc.subject.classification	Treballs de fi de grau	cat
dc.subject.other	Anisotropy	eng
dc.subject.other	Microscopy	eng
dc.subject.other	Bachelor's theses	eng
dc.title	Mueller Matrix Microscopy	eng
dc.type	info:eu-repo/semantics/bachelorThesis	ca

Fitxers

Mostrant 1 - 1 de 1