Anomalous crossover between thermal and shot noise in macroscopic diffusive conductors

dc.contributor.authorGomila Lluch, Gabrielcat
dc.contributor.authorReggiani, L. (Lino), 1941-cat
dc.date.accessioned2009-12-28T11:22:13Z
dc.date.available2009-12-28T11:22:13Z
dc.date.issued2000cat
dc.description.abstractWe predict the existence of an anomalous crossover between thermal and shot noise in macroscopic diffusive conductors. We first show that, besides thermal noise, these systems may also exhibit shot noise due to fluctuations of the total number of carriers in the system. Then we show that at increasing currents the crossover between the two noise behaviors is anomalous, in the sense that the low-frequency current spectral density displays a region with a superlinear dependence on the current up to a cubic law. The anomaly is due to the nontrivial coupling in the presence of the long-range Coulomb interaction among the three time scales relevant to the phenomenon, namely, diffusion, transit, and dielectric relaxation time.eng
dc.format.extent4 p.cat
dc.format.mimetypeapplication/pdfeng
dc.identifier.idgrec526799cat
dc.identifier.issn0163-1829cat
dc.identifier.urihttps://hdl.handle.net/2445/10600
dc.language.isoengeng
dc.publisherThe American Physical Societyeng
dc.relation.isformatofReproducció digital del document publicat en format paper, proporcionada per PROLA i http://dx.doi.org/10.1103/PhysRevB.62.8068cat
dc.relation.ispartofPhysical Review B, 2000, vol. 62, núm. 12, p. 8068-8071eng
dc.relation.urihttp://dx.doi.org/10.1103/PhysRevB.62.8068
dc.rights(c) The American Physical Society, 2000eng
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationSoroll electròniccat
dc.subject.classificationFluctuations (Physics)cat
dc.subject.classificationSemiconductorscat
dc.subject.otherElectronic noiseeng
dc.subject.otherFluctuations (Physics)eng
dc.subject.otherSemiconductorseng
dc.titleAnomalous crossover between thermal and shot noise in macroscopic diffusive conductorseng
dc.typeinfo:eu-repo/semantics/articleeng
dc.typeinfo:eu-repo/semantics/publishedVersion

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