A low-cost small-size commercial PIN photodiode: II. Comparison of measurements with monoenergetic electrons to analytical expressions and Monte Carlo simulations

dc.contributor.authorMangiarotti, Alessio
dc.contributor.authorPetri, Anna R.
dc.contributor.authorMalafronte, Alexandre A.
dc.contributor.authorGonçalves, Josemary A.C.
dc.contributor.authorBarros, Suelen F.
dc.contributor.authorBueno, C.C.
dc.contributor.authorFernández Varea, José María
dc.contributor.authorMaidana, Nora L.
dc.contributor.authorMartins, Marcos N.
dc.contributor.authorVanin, Vito R.
dc.date.accessioned2026-01-30T08:07:48Z
dc.date.available2026-01-30T08:07:48Z
dc.date.issued2021-01-01
dc.date.updated2026-01-30T08:07:48Z
dc.description.abstract<p>Commercial PIN photodiodes, repurposed as particle detectors, have received a lot of attention along the past</p><p>decades because they can offer a low-cost solution suitable for several applications. The BPX-65 photodiode has</p><p>been chosen because of its interesting features for measuring electrons in a harsh radiation environment close to</p><p>the beam of an accelerator. Its electrical characterisation and its application to photon spectrometry have been</p><p>presented in the companion paper I. Here, its response function (RF) to electrons is investigated using the beam</p><p>from an electron accelerator with a small energy spread. The empirical expressions for the RF available in the</p><p>literature have been improved, simplified, and combined to obtain a final form with 7 free parameters: 4 nonlinear</p><p>and 3 linear. A special fitting procedure, which takes advantage of the presence of the linear parameters,</p><p>is described. The behaviour of these parameters with beam energy and bias is investigated to uncover the</p><p>physical origin of the three components included in the proposed RF. The interpretation of the features of the</p><p>spectra is confirmed by Monte Carlo simulations carried out employing the general-purpose PENELOPE/penEasy</p><p>package. To take into account the charge-collection properties of the device, a simple model has been implemented</p><p>and is compared to data. It has then been possible to estimate the thickness of the partially dead layer</p><p>from the experiment.</p>
dc.format.extent20 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec712761
dc.identifier.issn0969-806X
dc.identifier.urihttps://hdl.handle.net/2445/226455
dc.language.isoeng
dc.publisherElsevier Ltd.
dc.relation.isformatofVersió postprint del document publicat a: https://doi.org/10.1016/j.radphyschem.2020.109102
dc.relation.ispartofRadiation Physics and Chemistry, 2021, vol. 182, p. 109102-1-109102-20
dc.relation.urihttps://doi.org/10.1016/j.radphyschem.2020.109102
dc.rightscc-by-nc-nd (c) Elsevier Ltd., 2021
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.classificationElectronsca
dc.subject.classificationDetectors de radiacióca
dc.subject.classificationDíodes
dc.subject.classificationMètode de Montecarloca
dc.subject.otherElectronesen
dc.subject.otherNuclear countersen
dc.subject.otherDiodes
dc.subject.otherMonte Carlo methoden
dc.titleA low-cost small-size commercial PIN photodiode: II. Comparison of measurements with monoenergetic electrons to analytical expressions and Monte Carlo simulations
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/acceptedVersion

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