Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals

dc.contributor.authorLevcenko, Sergiu
dc.contributor.authorHajdeu Chicarosh, Elena
dc.contributor.authorGarcia Llamas, Elena
dc.contributor.authorCaballero, Raquel
dc.contributor.authorSerna, Rosalía
dc.contributor.authorBodnar, Ivan V.
dc.contributor.authorVictorov, Ivan A.
dc.contributor.authorGuc, Maxim
dc.contributor.authorMerino, José Manuel
dc.contributor.authorPérez Rodríguez, Alejandro
dc.contributor.authorArushanov, Ernest
dc.contributor.authorLeón, Máximo
dc.date.accessioned2019-06-06T10:13:26Z
dc.date.available2019-06-06T10:13:26Z
dc.date.issued2018-04-19
dc.date.updated2019-06-06T10:13:27Z
dc.description.abstractThe linear optical properties of Cu2ZnSnS4 bulk poly-crystals have been investigated using spectroscopic ellipsometry in the range of 1.2-4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband transitions at the corresponding critical points in the Brillouin zone. The experimental data have been modeled over the entire spectral range taking into account the lowest E0 transition near the fundamental absorption edge and E1A and E1B higher energy interband transitions. In addition, the spectral dependences of the refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity values have been accurately determined and are provided since they are essential data for the design of Cu2ZnSnS4 based optoelectronic devices.
dc.format.extent1 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec683366
dc.identifier.issn0003-6951
dc.identifier.urihttps://hdl.handle.net/2445/134698
dc.language.isoeng
dc.publisherAmerican Institute of Physics
dc.relation.isformatofReproducció del document publicat a: https://doi.org/10.1063/1.5024683
dc.relation.ispartofApplied Physics Letters, 2018, vol. 112, num. 16, p. 161901-1-161901-5
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/H2020/777968/EU//INFINITE-CELL
dc.relation.urihttps://doi.org/10.1063/1.5024683
dc.rights(c) American Institute of Physics , 2018
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Enginyeria Electrònica i Biomèdica)
dc.subject.classificationEl·lipsometria
dc.subject.classificationDispositius optoelectrònics
dc.subject.classificationPropietats òptiques
dc.subject.otherEllipsometry
dc.subject.otherOptoelectronic devices
dc.subject.otherOptical properties
dc.titleSpectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion

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