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Si us plau utilitzeu sempre aquest identificador per citar o enllaçar aquest document: https://hdl.handle.net/2445/32145
Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping
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Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical
conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM
instruments of voltages 100 to 300 kV to turn them into true electron iffractometers, thus enabling electron crystallography. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscatter Diffraction (EBSD) technique in Scanning Electron
Microscopes (SEM) at lower magnifications and longer acquisition times.
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Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
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PORTILLO I SERRA, Joaquim. Precession electron diffraction in the transmission electron Microscope: electron crystallography and orientational mapping. _Capítol del llibre: Handbook of instrumental techniques for materials_. chemical and biosciences research. Vol. Universitat de Barcelona, núm. Barcelona, pàgs. Part I. [consulta: 27 de novembre de 2025]. [Disponible a: https://hdl.handle.net/2445/32145]