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2017-03-07

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Please use this identifier to cite or link to this item: https://hdl.handle.net/2445/128199

Evidence of a minoritary monoclinic LaNiO<sub>2.5</sub> phase in lanthanum nickelate thin films

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https://doi.org/10.1039/c7cp00902j

Abstract

LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging. The strain state of the films is studied using Geometric Phase Analysis (GPA). Results show the successful in-plane adaptation of the films to the substrates, both in the compressive (LAO) and tensile (LSAT) cases. Through the systematic analysis of HRTEM superstructure contrast modulation along different crystal orientations, localized regions of the monoclinic LaNiO2.5 phase are detected in the 35 nm films.

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Ciència dels materials, Cristal·lografia, Pel·lícules fines, Òxids metàl·lics, Estructura electrònica

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Materials science, Crystallography, Thin films, Metallic oxides, Electronic structure

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Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
Articles publicats en revistes (Institut de Nanociència i Nanotecnologia (IN2UB))

Citation

LÓPEZ CONESA, Lluís, et al. Evidence of a minoritary monoclinic LaNiO2.5 phase in lanthanum nickelate thin films. Physical Chemistry Chemical Physics. 2017. Vol. 19, num. 13, pags. 9137-9142. ISSN 1463-9076. [consulted: 16 of June of 2026]. Available at: https://hdl.handle.net/2445/128199

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