Theory of surface noise under Coulomb correlations between carriers and surface states

dc.contributor.authorKochelap, V. A. (Viacheslav Aleksandrovich)cat
dc.contributor.authorSokolov, V. N.cat
dc.contributor.authorBulashenko, Olegcat
dc.contributor.authorRubí Capaceti, José Miguelcat
dc.date.accessioned2012-02-16T08:49:40Z
dc.date.available2012-02-16T08:49:40Z
dc.date.issued2002
dc.description.abstractWe present a theory of the surface noise in a nonhomogeneous conductive channel adjacent to an insulating layer. The theory is based on the Langevin approach which accounts for the microscopic sources of fluctuations originated from trapping¿detrapping processes at the interface and intrachannel electron scattering. The general formulas for the fluctuations of the electron concentration, electric field as well as the current-noise spectral density have been derived. We show that due to the self-consistent electrostatic interaction, the current noise originating from different regions of the conductive channel appears to be spatially correlated on the length scale correspondent to the Debye screening length in the channel. The expression for the Hooge parameter for 1/f noise, modified by the presence of Coulomb interactions, has been derivedeng
dc.format.extent12 p.
dc.format.mimetypeapplication/pdf
dc.identifier.idgrec514168ca
dc.identifier.issn0021-8979
dc.identifier.urihttps://hdl.handle.net/2445/22096
dc.language.isoengeng
dc.publisherAmerican Institute of Physics
dc.relation.isformatofReproducció del document publicat a: http://dx.doi.org/10.1063/1.1512698
dc.relation.ispartofJournal of Applied Physics, 2002, vol. 92, núm. 9, p. 5347-5358
dc.relation.urihttp://dx.doi.org/10.1063/1.1512698
dc.rightsNoiseeng
dc.rights(c) American Institute of Physics, 2002
dc.rights.accessRightsinfo:eu-repo/semantics/openAccess
dc.sourceArticles publicats en revistes (Física de la Matèria Condensada)
dc.subject.classificationSorollcat
dc.subject.classificationSuperfícies (Tecnologia)cat
dc.subject.classificationCamps elèctricscat
dc.subject.classificationCircuits de transistorscat
dc.subject.classificationSemiconductorscat
dc.subject.classificationElectrònicacat
dc.subject.otherSurfaces (Technology)eng
dc.subject.otherElectric fieldseng
dc.subject.otherTransistor circuitseng
dc.subject.otherSemiconductorseng
dc.subject.otherElectronicseng
dc.titleTheory of surface noise under Coulomb correlations between carriers and surface stateseng
dc.typeinfo:eu-repo/semantics/article
dc.typeinfo:eu-repo/semantics/publishedVersion

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