Browsing by Author Campmany i Guillot, Josep, 1966-
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) |
|---|---|---|
| 1991 | Effect of substrate temperature on deposition rate of rf plasma-deposited hydrogenated amorphous silicon thin films | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Morenza Gil, José Luis |
| Aug-1997 | In situ fast ellipsometric analysis of repetitive surface phenomena | Campmany i Guillot, Josep, 1966-; Costa i Balanzat, Josep; Canillas i Biosca, Adolf; Andújar Bella, José Luis; Bertrán Serra, Enric |
| 1996 | L'el·lipsometria, una eina de caracterització òptica dels materials | Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Pascual Miralles, Esther; Bertrán Serra, Enric |
| 1992 | Properties of amorphous silicon thin films grown in square wave modulated silane rf discharges. | Andújar Bella, José Luis; Bertrán Serra, Enric; Canillas i Biosca, Adolf; Campmany i Guillot, Josep, 1966-; Serra-Miralles, J.; Roch i Cunill, Carles; Lloret, A. |