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Issue DateTitleAuthor(s)
1-Dec-1984Reconstruction of the SiO2 structure damaged by low-energy Ar-implanted ionsGarrido Fernández, Blas; Samitier i Martí, Josep; Bota Ferragut, Sebastián Antonio; Moreno, J. A.; Montserrat i Martí, Josep; Morante i Lleonart, Joan Ramon
15-Feb-1997Analysis of geometrical effects on the behavior of transverse and longitudinal modes of amorphous silicon compoundsMoreno, J. A.; Garrido Fernández, Blas; Samitier i Martí, Josep; Morante i Lleonart, Joan Ramon
8-Jul-2005Size dependence of refractive index of Si nanoclusters embedded in SiO2Moreno Pastor, José Antonio; Garrido Fernández, Blas; Pellegrino, Paolo; García Favrot, Cristina; Arbiol i Cobos, Jordi; Morante i Lleonart, Joan Ramon; Marie, P.; Gourbilleau, Fabrice; Rizk, Richard